Technical Data
| Illumination / Saib System | Reflection: d/8 (Diffused illumination, 8 degree saib)Kev ntsuas ib txhij ntawm SCI / SCE (ISO7724/1, CIE No.15, ASTM E1164, ASTM-D1003-07, DIN5033 Teil7, JIS Z8722 Cov Qauv C)Transmittance d/0 (Diffused illumination, 0 degree saib) |
| Sensor | Silicon Photodiode Array |
| Txoj Kev Grating | Concave Grating |
| Sphere Dia | 152mm ib |
| Lub wavelength | 360-780 nm |
| Wavelength suab | 10nm ua |
| Ib nrab Band Dav | 5nm ua |
| Reflectance RangeKev daws teeb meem | 0-200%0.01% |
| Lub teeb Source | Pulse Xenon Teeb thiab LED |
| Kev ntsuas UV | Xws li UV, 400nm txiav, 420nm txiav, 460nm txiav |
| Lub Sijhawm Ntsuas | SCI/SCE <2sSCI+SCE <4s |
| Kev ntsuas Aperture | Reflectance: XLAV Φ30mm, LAV 18mm, MAV Φ11mm, SAV Φ6mmTransmittance: Φ25 hli(Auto aperture loj lees paub) |
| Transmittance Qauv Loj | Tsis txwv rau cov qauv dav thiab qhov siab, thickness ≤50mm |
| Rov ua dua | XLAV Spectrum Reflectance/Transmittance: standard deviation in 0.1%XLAV Chromaticity tus nqi: Tus qauv sib txawv hauv ΔE * ab 0.015 * Thaum lub phaj dawb calibration yog ntsuas 30 x ntawm 5-thib ob ntu tom qab dawb calibration |
| Daim ntawv cog lus Inter-Instrument | XLAV ΔE*ab 0.15 (BCRA Series II, Nruab nrab ntsuas 12 vuas, ntawm 23 ℃) |
| Illuminants | A, C, D50, D55, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12CWF, U30, DLF, NBF, TL83, TL84 |
| Lus | Lus Askiv, Lavxias, Mev, Portuguese, Nyiv, Thaib, Kauslim Teb, German, Fabkis, Polish, Suav (yooj yim thiab tsoos), |
| Zaub | Reflectance thiab Transmittance graph / tus nqi, xim tus nqi, xim txawv qhov tseem ceeb, dhau / tsis ua, xim simulation, xim tshuaj ntsuam xyuas, haze, kua chromaticity qhov tseem ceeb, xim nyiam |
| Saib lub kaum sab xis | 2 ° thiab 10 ° |
| Xim Spaces | L*a*b, L*C*h, Hunter Lab, Yxy, XYZ |
| Lwm Indices | ASTM E313-00, ASTM E313-73, CIE, ISO2470/R457, AATCC,Hunter, Taube Berger, Stensby)YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Tint (ASTM E313-00), Metamerism Performance index milm, stain ceev, xim ceev, ISO brightness, R457, A ntom, T ntom, E ntom, M ntom , APHA / Pt-Co / Hazen, Gardner, Saybolt, ASTM xim, Haze, Tag nrho Transmittance, Opacity, Xim Strength |
| Xim txawv | ΔE*ab, ΔE*CH, ΔE*uv, ΔE*cmc, ΔE*94, ΔE*00, ΔE*ab(hunter), 555 shade sort |
| Cia Nco | 8 GB U Disk rau cov ntaub ntawv khaws cia thiab hloov pauv |
| Qhov Loj | 7 nti kov npo |
| Hwj chim | 12V / 3A |
| Ua haujlwm kub | 5-40 ℃ (40-104F), txheeb ze av noo 80% (ntawm 35 ℃) tsis muaj condensation |
| Cia Kub | -20-45 ℃ (-4-113F), txheeb ze av noo 80% (ntawm 35 ℃) tsis condensation |
| Khoom siv | Fais fab Adaptor, USB Cable, fixture rau transmittance, U disk (PC software), Dub Calibration Cavity, Dawb thiab Ntsuab Calibration Pobzeb, Reflectance Test Support, 30mm, 18mm, 11mm thiab 6mm apertures, reflectance qauv fixture, iav Cell 40x10mm |
| Xaiv cov khoom siv | Cua sov Fixture rau Transmittance, Vertical Support thiab Pneumatic ram rau downward ntsuas, Reflectance fixture rau cov qauv me me, Reflectance iav Cell Support, Corrosion-Resistant Protective Phaj (tsis yog tshem tau), Sample Holder rau Fiber, Zaj duab xis Fixture, Transmittance Fixture rau me me Aperture , Trolley Case, European Standard Plug, American Standard Plug |
| Interface | USB, USB-B thiab RS-232 |
| Ntsuas Qhov Loj | 465 x 240 x 260 mm |
| Qhov hnyav | 10, 8kgs |
| Lwm Txoj Haujlwm | 1. Lub koob yees duab saib xyuas thaj tsam;2. Txhawb txoj kev ntsuas kab rov tav, ntsug thiab nqes nqes (xav tau cov khoom siv xaiv los txhawb kev ntsuas qis);3. Nws pib cov av noo thiab kub them nyiaj ua haujlwm. |